Rapid Determination of Layer Number in Two-dimensional Materials using Four-wave Mixing Spectroscopy (JM4A.51)
Presenter: Torben Purz, MONSTR Sense Technologies
We demonstrate a rapid non-contact determination of layer thickness for exfoliated transition metal dichalcogenides using hyperspectral four-wave mixing imaging, which can be applied for in-situ growth characterization. We corroborate the measurements using atomic force microscopy.
Authors:Torben Purz, MONSTR Sense Technologies / Eric Martin, MONSTR Sense Technologies / Adam Alfrey, University of Michigan / Yuhang Cao, University of Michigan / Hui Deng, University of Michigan / Steven Cundiff, MONSTR Sense Technologies