• Technical Conference:  23 – 26 September 2024
  • Science + Industry Showcase:   24 – 25 September 2024
  • Colorado Convention Center, Denver, Colorado, USA
Home > ePosters > Poster

Poster

Towards Ultrasensitive Phase-Shift Metrology With Nonlinear Optical Transient Detection (JM4A.64)

Presenter: German de Valcarcel, Universitat de Valencia

Optical interferometry provides the most accurate spatial measurements. Here, we demonstrate, experimentally and theoretically, a massive improvement over existing techniques using nonlinear photorefractive wave-mixing and tabletop Mach-Zehnder interferometers, allowing displacement measurements with sub-nanometer accuracy.

Authors:Adolfo Esteban-Martin, Universitat de Valencia / Jose Esteve-Taboada, Universitat de Valencia / Fernando Silva, Universitat de Valencia / Eugenio Roldan, Universitat de Valencia / Javier Garcia-Monreal, Universitat de Valencia / German de Valcarcel, Universitat de Valencia


Poster Presentation

Authentication Required

Access to poster content is available to logged in registered attendees, please login now to participate.